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Imaging Single Dopant Atoms and Nanoclusters in Highly n-type Bulk Si
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1614-1615
- Print publication:
- August 2002
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Characterizing Trace Metal Impurities in Optical Waveguide Materials Using X-Ray Absorption
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- Journal:
- MRS Online Proceedings Library Archive / Volume 524 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 251
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- 1998
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Evidence for Local Atomic Strain in Pb-Doped Heavy-Metal Fluoride Glasses
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- Journal:
- MRS Online Proceedings Library Archive / Volume 417 / 1995
- Published online by Cambridge University Press:
- 10 February 2011, 175
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- 1995
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Dopant Quantification By X-Ray Absorption Spectroscopy: Zn IN InP
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 509
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- 1995
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X-Ray Absorption Spectroscopy from H-Passivated Porous Si and Oxidized Si Nanocrystals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 375 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 113
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- 1994
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Size, Shape, and Crystallinity of Luminescent Structures in Oxidized Si Nanoclusters and H-Passivated Porous Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
- Published online by Cambridge University Press:
- 28 February 2011, 407
- Print publication:
- 1994
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Correlation of Electrical, Structural, and Optical Properties of Erbium in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 298 / 1993
- Published online by Cambridge University Press:
- 25 February 2011, 447
- Print publication:
- 1993
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Correlation of Electrical, Structural, and Optical Properties of Erbium In Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 301 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 119
- Print publication:
- 1993
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